© 2016 Elsevier B.V. A common approach to studying β-delayed proton emission is to measure the energy of the emitted proton and corresponding nuclear recoil in a double-sided silicon-strip detector (DSSD) after implanting the β-delayed proton-emitting (βp) nucleus. However, in order to extract the proton-decay energy, the measured energy must be corrected for the additional energy implanted in the DSSD by the β-particle emitted from the βp nucleus, an effect referred to here as β-summing. We present an approach to determine an accurate correction for β-summing. Our method relies on the determination of the mean implantation depth of the βp nucleus within the DSSD by analyzing the shape of the total (proton + recoil + β) decay energy distribution shape. We validate this approach with other mean implantation depth measurement techniques that take advantage of energy deposition within DSSDs upstream and downstream of the implantation DSSD.