Logic synthesis is one of the key stages in the computer-aided design (CAD) flow for a field programmable gate array (FPGA) based design. It usually consists of a series of optimization iterations to improve the quality of results (QoR) of the design. Besides the traditional optimization objectives (e.g., performance, area, power), the reliability is becoming a main concern as modern FPGAs have advanced to 20nm technology, due to reduction in core voltage, decrease in transistor geometry, and increase in switching speed. However, existing techniques for enhancing the reliability of FPGA based designs fall behind industrial needs in terms of cost (e.g., area and power overhead), CAD flow, runtime, and the FPGA architecture.
To address the problems, this dissertation proposes several novel logic synthesis algorithms. The first algorithm seeks a formal method to improve the reliability of FPGA based designs while incurring minimal area and power overhead. The algorithm formulates the problem of the FPGA reliability under random faults as a stochastic satisfiability (SSAT) based Boolean matching, and employs robust templates to rewrite the look-up table (LUT) based netlist, to maximize the stochastic yield rate. To ensure not breaking the current CAD flow, a logic synthesis algorithm is presented that performs a SAT-based in-place reconfiguration in the LUT to mask soft errors, without changing of the functionality and topology of the LUT based netlist. In addition, the dissertation proposes three fast in-place logic synthesis algorithms targeting the modern FPGA architecture including both LUTs and interconnects, which perform simulation guided netlist analyses and utilize don't cares in the netlist to enhance the reliability of the design. The effectiveness of the proposed algorithms are verified by experimental results.