X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available LaAlO3(001) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with La 3d, O 1s, C 1s, La 4p, Al 2s, La 4d, Al 2p, La 5s, O 2s and La 5p core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, La 4d, Al 2p lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of LaAl1.03O2.23.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available PrScO3 (110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with Pr 3d, O 1s, Sc 2p, C 1s, Pr 4p, Pr 4d, Sc 3s, Pr 5s, Sc 3p, O 2s, and Pr 5p core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Sc 2p, Pr 4p lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of Pr1.12ScO2.29.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available NdScO3 (110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O KLL, Nd 3d, O 1s, Sc 2p, C 1s, Nd 4p, Nd 4d, Sc 3s, Nd 5s, Sc 3p, O 2s, and Nd 5p core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Sc 2p, Nd 4d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of NdSc1.14O2.94.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available YAlO3(110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Y 2p, C 1s, Y 3d, Al 2p, Y 4p, and O 2s core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Y 3d, Al 2p lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of YAl1.06O2.48.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available SrTiO3(001) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with O 1s, Ti 2p, C 1s, Sr 3p, Sr 3d, Ti 3p, Sr 4p, Ti 3p, Sr 4p, and O 2s core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Ti 2p, Sr 3d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of Sr1.16TiO2.09.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available NdGaO3 (110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with Ga 2p, Nd 3d, O 1s, C 1s, Nd 4p3/2, Ga 3s, Nd 4d, Ga 3p, Nd 5s, O 2s, Ga 3d and Nd 5p core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Nd 4d, Ga 3p lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of Nd1.13GaO2.17.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available DyScO3 (110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with Dy 3d, O 1s, Sc 2p, Dy 4p, C 1s, Dy 4d, Sc 3s, Dy 5s, Sc 3p, Tb 5p, and O 2s core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Sc 2p, Dy 4d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of DySc1.03O2.29.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available (LaAlO3)0.3(Sr2TaAlO6)0.7 (001) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with La 3d, O 1s, C 1s, Sr 3p, Ta 4d, La 4p, Sr 3d, Al 2s, La 4d, Al 2p, Ta 5p, La 5s, Ta 4f, O 2s, Sr 4p and La 5p core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Sr 3d, La 4d, Al 2p Ta 4f lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of La0.34Sr0.88Al0.82Ta0.43O3.

X-ray photoelectron spectroscopy (XPS) was used to analyze a commercially available GdScO3 (110) bulk single crystal. XP spectra were obtained using incident monochromatic Al Kα radiation at 0.83401 nm. A survey spectrum together with Gd 3d, O 1s, Sc 2p, Gd 4p, C 1s, Gd 4d, Sc 3s, Gd 5s, Sc 3p, O 2s, Gd 5p, and Gd 4f core level spectra and the valence band are presented. The spectra indicate the principle core level photoelectron and Auger electron signals and show only minor carbon contamination. Making use of the O 1s, Sc 2p, Gd 4d lines and neglecting the components related to surface contaminants, XPS quantitative analysis reveals an altered stoichiometry of the air-exposed crystal surface of Gd1.07ScO2.21.