To enable health monitoring and fault diagnosis of PV modules using current-voltage characteristics (I–V curves), it is generally necessary to correct the I–V curves measured under different environmental conditions to the standard condition. The most common correction methods are those from IEC 60891: 2021 standard. However, these methods can introduce significant errors when dealing with degraded PV modules due to the inability to account for changes in resistance. To address this, we propose an improved I–V curve procedure, denoted Pdynamic, which considers different types of degradation by dynamically deriving the correction coefficients from the measured I–V curves. To evaluate the performance, we simulate I–V curves across a wide range of irradiance and temperature for the healthy and degraded module, where the degradation involves increased series resistance, decreased shunt resistance, or both. The results reveal that Pdynamic can produce corrected I–V curves closer to the reference ones than Procedures 1, 2, and 4 of the IEC 60891:2021 standard. Moreover, Pdynamic exhibits resilience to both seasonal fluctuations and varying levels of degradation. These results highlight Pdynamic as a promising and robust I–V curve correction method, particularly for degraded PV modules. A Python-based open-source tool for this procedure is also available at https://github.com/DuraMAT/IVcorrection.

Physics-based circuit parameters like series and shunt resistance are essential to provide insights into the degradation status of photovoltaic (PV) arrays. However, calculating these parameters typically requires a full current–voltage characteristic (I-V curve), the acquisition of which involves specific measurement devices and costly methods. Thus, I-V curves of the PV system level are often not available. This paper proposes a methodology (PVPRO) to estimate these I-V curve parameters using only operation (string-level DC voltage and current) and weather data (irradiance and temperature). PVPRO first performs multi-stage data pre-processing to remove noisy data. Next, the time-series DC data are used to fit an equivalent circuit single-diode model (SDM) to estimate the circuit parameters by minimizing the differences between the measured and estimated values. In this way, the time evolutions of the SDM parameters are obtained. We evaluate PVPRO on synthetic datasets and find an excellent estimation of both SDM and the key I-V parameters (e.g., open-circuit voltage, short-circuit current, maximum power, etc.) with an average relative error of 0.55%. The performance, especially the extracted degradation rate of parameters, is robust to various measurement noises and the presence of faults. In addition, PVPRO is applied to a 271 kW PV field system. The relative error between the real and estimated operation voltage and current is less than 1%, suggesting that degradation trends are well captured. PVPRO represents a promising open-source tool to extract the time-series degradation trends of key PV parameters from routine operation data.