- Goldberg, Kenneth A;
- Wojdyla, Antoine;
- Bryant, Diane;
- Shi, Xianbo;
- Rebuffi, Luca;
- Frith, Matthew;
- Highland, Matthew;
- Assoufid, Lahsen;
- Ichii, Yoshio;
- Inoue, Takato;
- Yamauchi, Kazuto
- Editor(s): Assoufid, Lahsen;
- Ohashi, Haruhiko;
- Siewert, Frank
At Lawrence Berkeley National Laboratory's Advanced Light Source, we are developing x-ray wavefront sensors to support the creation and operation of beamlines with diffraction-limited quality. Our new approach to rapid, intermittent wavefront sensing operates in reflection at glancing incidence angles and is compatible with the high-power densities of modern beamlines. For soft x-ray applications especially, the wavefront sensor can operate upstream of the exit slit in a vertically dispersed beam. This single-shot technique supports lateral shearing interferometry and Hartmann wavefront sensing; it can be adapted to speckle-based techniques as well. The reflected beam is directed to an off-axis YAG crystal that produces scintillated visible light. A small mirror reflects the light to a microscope and camera, and the measured wavefront shape information can be used as feedback to adaptive x-ray mirror elements. A compact array of gratings enables measurement across a broad range of photon energies or wavefront curvatures. We describe recent demonstrations at soft x-ray and hard x-ray wavelengths measuring an adaptive x-ray mirror, and a toroidal focusing mirror.