Transmission electron microscopy (TEM) is an indispensable and versatile characterizationtool, offering high resolution and a wide range of techniques for probing the intricate details
of materials at the atomic scale. It is the Swiss Army knife of characterization tools. TEM
utilizes a beam of high-energy electrons transmitted through a thin specimen to produce
highly resolved images, diffraction patterns, and energy spectra. This enables researchers the
exploration of morphology, crystal structure, defects, composition, and electronic structure
of materials with high spatial and energy resolution.
In traditional TEM imaging, bright-field and dark-field techniques provide valuable insightsinto the crystallographic orientations, defects, and strain within a material. Bright-field
imaging generates a high-contrast image of the specimen’s features, while dark-field imaging
selectively scatters electrons from specific crystal planes, making defects and dislocations
more visible. These methods allow for the characterization of defects, grain boundaries, and
phase boundaries, aiding in the understanding of material properties and behavior.
Modern methods in TEM have expanded the capabilities even further and increasingly rely
on custom data processing and “big data” analysis. Scanning nanodiffraction, performed
in the scanning TEM (STEM) configuration, enables the local mapping of crystallographic
information with nanoscale resolution, making it possible to analyze the strain distribution
and lattice distortions in materials. Additionally, electron energy-loss spectroscopy enables
the investigation of the energy losses experienced by the electron beam as it interacts with
the sample, offering valuable information about elemental composition, chemical bonding,
and electronic structure.
TEM’s ability to reveal atomic-scale details and its versatility in utilizing a variety of tech-niques make it an invaluable tool for scientists and researchers across numerous disciplines.
The work presented in the following chapters relies on a selection of TEM methods, including
scanning nanodiffraction, high-resolution TEM, Lorentz TEM, and monochromated electron energy-loss spectroscopy (EELS) and takes advantage of access to advanced microscopes at
the National Center for Electron Microscopy. Elegant and accurate analysis of the data
produced with these techniques required the development of custom codes or the utilization
of emergent data processing pipelines.
In the subsequent chapters of this work, amorphous Ta (tantalum) and Tb-Co (terbium-cobalt) are analyzed using fluctuation electron microscopy (FEM), a technique that exhibits
unique sensitivity to medium-range ordering in disordered materials. Simulated and de-
posited Ta films are used to demonstrate the applicability of FEM data for measuring ori-
ented strain. Through various analysis pathways, FEM allows us to determine the degree
of medium-range ordering (MRO) and strain in amorphous thin films. FEM is applied to
the study of magnetron sputtered amorphous Ta thin films at different tilt angles, reveal-
ing isotropic strain and validating the approach through electron diffraction simulations. A
custom workflow and analysis code enable the acquisition of tilted scanning nanodiffraction
data, facilitating the determination of strain and ordering in different directions while ad-
dressing potential strain-induced artifacts. Detection limitations for low-strain films are also
determined through this method.
Additionally, changes in the perpendicular magnetic anisotropy of amorphous thin films ofTb-Co grown through magnetron co-sputtering are observed and tuned by varying growth
and annealing temperatures. The magnetic anisotropy constant increases with higher growth
temperatures but decreases when annealing temperatures exceed the growth temperature.
Once again, FEM is employed to reveal that MRO increases with higher growth temperatures
and decreases with higher annealing temperatures, indicating a correlation between magnetic
anisotropy and local atomic ordering. These findings suggest that temperature-mediated
adatom configurations during deposition result in preferential ordering along the growth
direction, with oriented MRO aligning with larger anisotropy constants.
Shifting the focus to obsidian glass in Chapter 4, we move away from previous discussions on
lab-made amorphous materials and delve into the study of obsidian, a volcanic glass formed
through the rapid cooling of silica-rich melt. Within the amorphous matrix of obsidian,
nano-scale crystallites offer valuable insights into the flow kinetics and composition of the
melt. To analyze these crystallites, we prepare samples with nanometer-thin edges using
the conchoidal fracture of obsidian for TEM analysis. Employing techniques such as energy-
dispersive spectroscopy, electron diffraction, and RDF analysis, we examine the nanolites
within the amorphous matrix. Our analysis reveals patterns of specific cation depletion near
Fe-oxide nanolites, highlighting the influence of nanolites on the nearby short-range ordering
and atomic characteristics of the matrix. These effects result in measurable localized changes
in the amorphous structure, evident in decreased mean nearest neighbor distances compared
to the bulk matrix.
The final chapters of this thesis concentrate on deepening our understanding of the elec-tronic structure of lanthanide intermetallics and its connection to their bulk properties. We present a survey of lanthanide M4,5 edge data obtained using EELS from various members
of the Ln2Co3Ge5 series, with a particular emphasis on Ce, Sm, Pr, Gd, and Yb. The EELS
measurements are conducted on crystalline samples using an aberration-corrected TEAM I
transmission electron microscope (TEM), and we analyze the collected data to establish re-
lationships between the electronic structures of lanthanides and the behavior of Co in these
compounds. Understanding the electronic and atomic structures of lanthanide systems is
crucial for tailoring their properties to suit different scientific applications. Recent stud-
ies have demonstrated that the conventional tight-binding model for f -electron materials
is not universally accurate. Therefore, investigating the electronic and atomic structures
of lanthanide systems provides valuable insights for designing and manipulating quantum
materials with desired properties, considering the influence of itinerancy and crystal field
interactions on magnetic properties and other characteristics.
Furthermore, a specific case study focusing on monoclinic Sm2Co3Ge5, a member of the
Ln2Co3Ge5 series, is presented. This study investigates the impact of twin grain boundaries
on local atomic distortion and electronic structure. The measured magnetic moment exceeds
the expected moment of trivalent Sm, implying a magnetic contribution from Co. Twinning,
observed along (100) planes, is examined using monochromated EELS and high-resolution
TEM. The analysis uncovers shear strain at the twin boundaries and distinct fine structure
in the Co L2,3 edges, indicating 3d -electron hybridization and the occupation of states that
are absent in bulk grain spectra. These findings offer valuable insights into manipulating
the bulk properties of lanthanide-transition metal systems with complex magnetism. The
observed change in electronic structure also provides an explanation for the elevated magnetic
moment measured in the system.
A multitude of TEM methods are applied to the study of amorphous and magnetic materials,showcasing the versatility of TEM in diverse material systems. Amorphous materials, with
their lack of long-range atomic ordering, present challenges in structural interpretation. To
overcome this, statistical methods are employed to define average values that are correlated to
bulk properties, providing valuable insights into the behavior of these materials. On the other
hand, magnetic materials provide an exciting avenue for TEM characterization, allowing
for investigations not only into crystal structure, but also electronic and magnetic domain
structures. This multifaceted approach offers a clearer picture of the factors influencing
magnetism across multiple length scales, facilitating a deeper understanding of magnetic
materials and their properties.