ON THE UTILITY OF DARK FIELD ELECTRON MICROSCOPY IN THE DETERMINATION OF THE DEGREE OF DEFORMATION IN CHRYSOTILE ASBESTOS: AN ENVIRONMENTAL RESEARCH APPLICATION

ON THE INSENSITIVITY TO TILTS OF THE ELECTRON DIFFRACTION PATTERNS OF AMPHIBOLE ASBESTOS FIBERS

NON-CONVENTIONAL ELECTRON MICROSCOPY IN SMALL DEFECT CHARACTERIZATION

IDENTIFICATION OF FAULTS IN ASBESTOS MINERALS and APPLICATION TO POLLUTION STUDIES

EXPLANATION FOR THE INSENSITIVITY TO TILTS OF THE ELECTRON DIFFRACTION PATTERNS OF AMPHIBOLE ASBESTOS FIBERS

ON PRECIPITATION OF PHOSPHOROUS IN ION IMPLANTED SILICON

A THREE-STAGE MODEL FOR THE DEVELOPMENT OF SECONDARY DEFECTS IN ION-IMPLANTED SILICON

HIGH RESOLUTION IMAGING IN BRIGHT AND DARK FIELD AT HIGH VOLTAGES

THE NATURE AND HABIT PLANES OF DEFECTS IN P+ ION-IMPLANTED SILICON

SOME NEW RESULTS IN THE CHARACTERIZATION OF DEFECTS IN PHOSPHOROUS ION-IMPLANTED SILICON