Utilisation of partially coherent X-rays in Coherent X-ray Diffraction Imaging (CDI) and X-ray ptychography have brought intense research and developments for the past few years. Generally, data reconstructions convergence can be achieved by considering to incorporate partially coherent X-rays in ptychographic iterative reconstructions algorithms. Recently, exploration of both X-ray probe and sample modes have been studied and it was suggested that sufficient constraints are required to achieve accurate data reconstructions due to the mathematical inseparability of multiple sample modes that are superimposed into a single set of ptychographic intensity patterns. Here we review the multi-modal ptychography that can be used as a new emerging technique to investigate dynamical sample systems with partially coherent X-rays by recent experimental and simulated demonstrations.

Tailoring structural, chemical, and electronic (dis-)order in heterogeneous media is one of the transformative opportunities to enable new functionalities and sciences in energy and quantum materials. This endeavor requires elemental, chemical, and magnetic sensitivities at the nano/atomic scale in two- and three-dimensional space. Soft X-ray radiation and hard X-ray radiation provided by synchrotron facilities have emerged as standard characterization probes owing to their inherent element-specificity and high intensity. One of the most promising methods in view of sensitivity and spatial resolution is coherent diffraction imaging, namely, X-ray ptychography, which is envisioned to take on the dominance of electron imaging techniques offering with atomic resolution in the age of diffraction limited light sources. In this review, we discuss the current research examples of far-field diffraction-based X-ray ptychography on two-dimensional and three-dimensional semiconductors, ferroelectrics, and ferromagnets and their blooming future as a mainstream tool for materials sciences.

We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro-microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.