Electron and X-ray interactions with matter can be recorded as digital images, which are signal acquisition mechanisms often used to investigate materials microstructure. Recently, the ability to quickly acquire large datasets at high resolution has created new challenges in areas that rely upon image-based information. The proposed analysis schemes employ Convolutional Neural Networks as the core algorithm in the reconnaissance of expected events from data gathered in two regimes: experimentally and by simulation. At the interface of physical and digital datasets, we propose classification schemes that exploit complex geometrical structure from scientific images through different machine learning packages, such as MatConvNet and TensorFlow. Our results show correct classification rates over 90% considering thousands of samples from four image modalities: cryo-electron microscopy, X-ray diffraction, X-ray scattering and X-ray microtomography. Our main contributions are: (a) developing algorithms designed for data that stem from physical experiments; (b) building new software to constrain parameter space, particularly given new hardware; and (c) testing different CNN models for classification of scientific images.

Nano-structured thin films have a variety of applications from waveguides, gaseous sensors to piezoelectric devices. Grazing Incidence Small Angle x-ray Scattering images enable classification of such materials. One challenge is to determine structure information from scattering patterns alone. This paper highlights the design of multiple Convolutional Neural Networks (CNN) to classify nanoparticle orientation in a thin film by learning scattering patterns. The network was trained on several thin films with a success rate of 94%. We demonstrate CNN robustness under different noises as well as demonstrate the potential of our proposed approach as a strategy to decrease scattering pattern analysis time.

Xi-cam is an extensible platform for data management, analysis and visualization. Xi-cam aims to provide a flexible and extensible approach to synchrotron data treatment as a solution to rising demands for high-volume/high-throughput processing pipelines. The core of Xi-cam is an extensible plugin-based graphical user interface platform which provides users with an interactive interface to processing algorithms. Plugins are available for SAXS/WAXS/GISAXS/GIWAXS, tomography and NEXAFS data. With Xi-cam's `advanced' mode, data processing steps are designed as a graph-based workflow, which can be executed live, locally or remotely. Remote execution utilizes high-performance computing or de-localized resources, allowing for the effective reduction of high-throughput data. Xi-cam's plugin-based architecture targets cross-facility and cross-technique collaborative development, in support of multi-modal analysis. Xi-cam is open-source and cross-platform, and available for download on GitHub.