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Measurements of 1/f Noise in A-Si: H Pin Diodes and Thin-Film-Transistors

  • Author(s): Cho, G.
  • Drewery, J.S.
  • Fujieda, I.
  • Jing, T.
  • Kaplan, S.N.
  • Perez-Mendez, V.
  • Qureshi, S.
  • Wildermuth, D.
  • Street, R.A.
  • et al.
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