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Convolutional neural networks for grazing incidence x-ray scattering patterns: thin film structure identification

  • Author(s): Liu, Shuai
  • Melton, Charles N
  • Venkatakrishnan, Singanallur
  • Pandolfi, Ronald J
  • Freychet, Guillaume
  • Kumar, Dinesh
  • Tang, Haoran
  • Hexemer, Alexander
  • Ushizima, Daniela M
  • et al.
Abstract

Abstract

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