Qubit Metrology of Ultralow Phase Noise Using Randomized Benchmarking
Published Web Locationhttps://doi.org/10.1103/PhysRevApplied.3.044009
A precise measurement of dephasing over a range of time scales is critical for improving quantum gates beyond the error correction threshold. We present a metrological tool based on randomized benchmarking capable of greatly increasing the precision of Ramsey and spin-echo sequences by the repeated but incoherent addition of phase noise. We find our superconducting-quantum-interference-device-based qubit is not limited by 1/f flux noise at short time scales but instead observe a telegraph noise mechanism that is not amenable to study with standard measurement techniques.