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Qubit Metrology of Ultralow Phase Noise Using Randomized Benchmarking

  • Author(s): O'Malley, PJJ
  • Kelly, J
  • Barends, R
  • Campbell, B
  • Chen, Y
  • Chen, Z
  • Chiaro, B
  • Dunsworth, A
  • Fowler, AG
  • Hoi, IC
  • Jeffrey, E
  • Megrant, A
  • Mutus, J
  • Neill, C
  • Quintana, C
  • Roushan, P
  • Sank, D
  • Vainsencher, A
  • Wenner, J
  • White, TC
  • Korotkov, AN
  • Cleland, AN
  • Martinis, JM
  • et al.
Abstract

© 2015 American Physical Society. A precise measurement of dephasing over a range of time scales is critical for improving quantum gates beyond the error correction threshold. We present a metrological tool based on randomized benchmarking capable of greatly increasing the precision of Ramsey and spin-echo sequences by the repeated but incoherent addition of phase noise. We find our superconducting-quantum-interference-device-based qubit is not limited by 1/f flux noise at short time scales but instead observe a telegraph noise mechanism that is not amenable to study with standard measurement techniques.

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