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Magnetization depth dependence in exchange biased thin films

  • Author(s): Morales, R.
  • Li, Z. P.
  • Petracic, O.
  • Batlle, X.
  • Schuller, I. K.
  • Olamit, J.
  • Liu, Kai
  • et al.
Abstract

The depth dependence of the magnetization has been studied in antiferromagnet/ferromagnet (AF/FM) exchange coupled systems. Results from vector magnetometry and magneto-optical Kerr effect probing both the AF/FM and FM/air interfaces demonstrate the existence of a magnetization depth profile in FeF2/FM (FM=Fe, Ni, and Py) bilayers, contrary to the assumptions of most exchange bias models. The appearance of asymmetrical hysteresis loops below the AF Néel temperature (T_N) is explained by the creation of spring-like walls parallel to the AF/FM interface and the existence of incomplete domain walls. Changes in the reversal mechanism above T_N have also been discussed.

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