Magnetization depth dependence in exchange biased thin films
- Author(s): Morales, R.
- Li, Z. P.
- Petracic, O.
- Batlle, X.
- Schuller, I. K.
- Olamit, J.
- Liu, Kai
- et al.
Published Web Locationhttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000089000007072504000001&idtype=cvips&type=ALERT
The depth dependence of the magnetization has been studied in antiferromagnet/ferromagnet (AF/FM) exchange coupled systems. Results from vector magnetometry and magneto-optical Kerr effect probing both the AF/FM and FM/air interfaces demonstrate the existence of a magnetization depth profile in FeF2/FM (FM=Fe, Ni, and Py) bilayers, contrary to the assumptions of most exchange bias models. The appearance of asymmetrical hysteresis loops below the AF Néel temperature (T_N) is explained by the creation of spring-like walls parallel to the AF/FM interface and the existence of incomplete domain walls. Changes in the reversal mechanism above T_N have also been discussed.
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