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Investigation of pit formation in laser-irradiated multilayer thin films by using optical coherence tomography

  • Author(s): Shin, Y;
  • Kim, H;
  • Kim, Y;
  • Park, S;
  • Jung, W;
  • Chen, Z;
  • Nelson, JS
  • et al.
Creative Commons 'BY' version 4.0 license
Abstract

We propose a novel application of optical coherence tomography (OCT) to monitor pit formation in laser-irradiated optical storage materials. A multilayer optical storage recordable compact disk is composed of multiple layers, each of different structure. The disks were irradiated with a Q-Switched Nd:YAG laser with an energy of 373 mJ. Post-irradiated disks were evaluated by using OCT, and the images were compared with those obtained by using optical microscopy. Our results indicate that OCT can be a useful instrument for investigating pit formation in multilayer optical storage disks and might also provide information on ways to optimize optical memory technology.

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