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Two-wave pattern shift aberration monitor for centrally obscured optical systems

  • Author(s): Cain, Jason P.
  • McIntyre, Gregory
  • Naulleau, Patrick
  • Pawloski, Adam
  • La Fontaine, Bruno
  • Wood, Obert
  • Spanos, Costas
  • Neureuther, Andrew R.
  • et al.
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