CRITICAL RESOLVED SHEAR STRESS MEASUREMENTS FOR SILICON-DOPED GaAs SINGLE CRYSTALS

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Open Access Publications from the University of California

Lawrence Berkeley National Laboratory

CRITICAL RESOLVED SHEAR STRESS MEASUREMENTS FOR SILICON-DOPED GaAs SINGLE CRYSTALS

1986

Author(s): Bourret, E.D.
Elliot, A.G.
Tabache, M.G.
et al.

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