Bulk band gaps in divalent hexaborides: A soft x-ray emission study
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Bulk band gaps in divalent hexaborides: A soft x-ray emission study

  • Author(s): Denlinger, Jonathan D.;
  • Gweon, Gey-Hong;
  • Allen, James W.;
  • Bianchi, Andrea D.;
  • Fisk, Zachary
  • et al.
Abstract

Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.

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