Bulk band gaps in divalent hexaborides: A soft x-ray emission study
Skip to main content
eScholarship
Open Access Publications from the University of California

Bulk band gaps in divalent hexaborides: A soft x-ray emission study

Abstract

Boron K-edge soft x-ray emission and absorption are used to address the fundamental question of whether divalent hexaborides are intrinsic semimetals or defect-doped bandgap insulators. These bulk sensitive measurements, complementary and consistent with surface-sensitive angle-resolved photoemission experiments, confirm the existence of a bulk band gap and the location of the chemical potential at the bottom of the conduction band.

Main Content
For improved accessibility of PDF content, download the file to your device.
Current View