Epitaxial strain and the magnetic properties of canted antiferromagnetic perovskite NaNiF3 thin films
- Author(s): Morley, SA
- Marquez, H
- Lederman, D
- et al.
Published Web Locationhttps://doi.org/10.1063/1.5126601
The perovskite crystal structure is known to exhibit a multitude of interesting physical phenomena owing to the intricate coupling of the electronic and magnetic properties to the structure. Fluoroperovskites offer an alternative chemistry to the much more widely studied oxide materials, which may prove advantageous for applications. It is demonstrated here for the first time that the antiferromagnetic perovskite fluoride, NaNiF , can be synthesized in thin film form. The films were grown via molecular beam epitaxy on SrTiO (100) substrates to produce high quality epitaxial films in the thickness range of 5-50 nm. The Pnma structure of the films was confirmed by x-ray diffraction. There was a decrease in the out-of-plane lattice spacing from the bulk value corresponding to a maximum strain of 1.7% in the thinnest film. Canted antiferromagnetism was measured in all films using magnetometry and a negative change in the antiferromagnetic ordering temperature of ΔT = - 9.1 ± 0.7 K was observed with increasing strain. 3 3 N