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Enhanced spin polarization of amorphous FexSi1-x thin films revealed by Andreev reflection spectroscopy
- Karel, J;
- Bouma, DS;
- Martinez, J;
- Zhang, YN;
- Gifford, JA;
- Zhang, J;
- Zhao, GJ;
- Kim, DR;
- Li, BC;
- Huang, ZY;
- Wu, RQ;
- Chen, TY;
- Hellman, F
Published Web Location
https://doi.org/10.1103/physrevmaterials.2.064411Abstract
Point contact Andreev reflection spectroscopy has been utilized to determine the spin polarization of both amorphous and crystalline FexSi1-x (0.58
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