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Enhanced spin polarization of amorphous F ex S i1-x thin films revealed by Andreev reflection spectroscopy

  • Author(s): Karel, J
  • Bouma, DS
  • Martinez, J
  • Zhang, YN
  • Gifford, JA
  • Zhang, J
  • Zhao, GJ
  • Kim, DR
  • Li, BC
  • Huang, ZY
  • Wu, RQ
  • Chen, TY
  • Hellman, F
  • et al.

Point contact Andreev reflection spectroscopy has been utilized to determine the spin polarization of both amorphous and crystalline FexSi1-x (0.58

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