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Enhanced spin polarization of amorphous F ex S i1-x thin films revealed by Andreev reflection spectroscopy

  • Author(s): Karel, J;
  • Bouma, DS;
  • Martinez, J;
  • Zhang, YN;
  • Gifford, JA;
  • Zhang, J;
  • Zhao, GJ;
  • Kim, DR;
  • Li, BC;
  • Huang, ZY;
  • Wu, RQ;
  • Chen, TY;
  • Hellman, F
  • et al.
Abstract

Point contact Andreev reflection spectroscopy has been utilized to determine the spin polarization of both amorphous and crystalline FexSi1-x (0.58

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