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Towards data-driven next-generation transmission electron microscopy
- Spurgeon, Steven R;
- Ophus, Colin;
- Jones, Lewys;
- Petford-Long, Amanda;
- Kalinin, Sergei V;
- Olszta, Matthew J;
- Dunin-Borkowski, Rafal E;
- Salmon, Norman;
- Hattar, Khalid;
- Yang, Wei-Chang D;
- Sharma, Renu;
- Du, Yingge;
- Chiaramonti, Ann;
- Zheng, Haimei;
- Buck, Edgar C;
- Kovarik, Libor;
- Penn, R Lee;
- Li, Dongsheng;
- Zhang, Xin;
- Murayama, Mitsuhiro;
- Taheri, Mitra L
- et al.
Published Web Location
https://doi.org/10.1038/s41563-020-00833-zAbstract
Electron microscopy touches on nearly every aspect of modern life, underpinning materials development for quantum computing, energy and medicine. We discuss the open, highly integrated and data-driven microscopy architecture needed to realize transformative discoveries in the coming decade.
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