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Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions
- Schwartz, Craig P;
- Raj, Sumana L;
- Jamnuch, Sasawat;
- Hull, Chris J;
- Miotti, Paolo;
- Lam, Royce K;
- Nordlund, Dennis;
- Uzundal, Can B;
- Pemmaraju, Chaitanya Das;
- Mincigrucci, Riccardo;
- Foglia, Laura;
- Simoncig, Alberto;
- Coreno, Marcello;
- Masciovecchio, Claudio;
- Giannessi, Luca;
- Poletto, Luca;
- Principi, Emiliano;
- Zuerch, Michael;
- Pascal, Tod A;
- Drisdell, Walter S;
- Saykally, Richard J
- et al.
Published Web Location
https://doi.org/10.1103/physrevlett.127.096801Abstract
Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron-Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).
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