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Grain Orientation and Strain Measurements in Sub-Micron Wide Passivated Individual Aluminum Test Structures
2001
Tamura, N
;
Valek, B C
;
Spolenak, R
;
MacDowell, A A
;
Celestre, R S
;
Padmore, H A
;
Brown, W L
;
Marieb, T
;
Bravman, J C
;
Batterman, B W
;
Patel, J R
et al.
...
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