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An X-ray photoemission electron microscope using electron mirror aberration corrector for the study of complex materials

  • Author(s): Feng, J.
  • Forest, E.
  • MacDowell, A.A.
  • Marcus, M.
  • Padmore, H.
  • Raoux, S.
  • Robin, D.
  • Scholl, A.
  • Schlueter, R.
  • Schmid, P.
  • Stohr, J.
  • Wan, W.
  • Wei, D.H.
  • Wu, Y.
  • et al.
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