On the feasibility to investigate point defects by advanced electron microscopy
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On the feasibility to investigate point defects by advanced electron microscopy

  • Author(s): Kisielowski, C.
  • Jinschek, J.R.
  • et al.
Abstract

Transmission Electron Microscopy evolves rapidly as a primary tool to investigate nano structures on a truly atomic level. Its resolution reaches into the sub Angstrom region by now. Together with a better correction of lens aberrations, sensitivities are drastically enhanced. Utilizing advanced electron microscopes, it is feasible to promote experiments that aim to detect single atoms. This enables local investigations of non-stoichiometry. This paper reviews the current state-of-the-art.

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