A Comparison of X-Ray Microdiffraction and Coherent Gradient sensing in Measuring Discontinuous Curvatures in Thin Film-Substrate systems
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A Comparison of X-Ray Microdiffraction and Coherent Gradient sensing in Measuring Discontinuous Curvatures in Thin Film-Substrate systems

  • Author(s): Brown, M.A.
  • Park, T.-S.
  • Rosakis, A.
  • Ustundag, E.
  • Huang, Y.
  • Tamura, N.
  • Valek, B.C.
  • et al.
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