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A Comparison of X-Ray Microdiffraction and Coherent Gradient sensing in Measuring
Discontinuous Curvatures in Thin Film-Substrate systems
- Author(s): Brown, M.A.
- Park, T.-S.
- Rosakis, A.
- Ustundag, E.
- Huang, Y.
- Tamura, N.
- Valek, B.C.
- et al.