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Characterization of buried thin films with resonant soft x-ray fluorescence (printed title is: Characterizing Buried Interfaces Using Resonant Soft X-Ray Fluorescence)

  • Author(s): Carlisle, J.A.;
  • Terminello, E.A.;
  • Hudson, E.A.;
  • Perera, R.C.C.;
  • Underwood, J.H.;
  • Callcott, T.A.;
  • Jia, J.J.;
  • Ederer, D.L.;
  • Himpsel, F.J.;
  • Samant, M.G.
  • et al.
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