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Accessing Defect Dynamics using Intense, Nanosecond Pulsed Ion Beams

  • Author(s): Persaud, A
  • Barnard, JJ
  • Guo, H
  • Hosemann, P
  • Lidia, S
  • Minor, AM
  • Seidl, PA
  • Schenkel, T
  • et al.
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