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High-temperature piezoresponse force microscopy

  • Author(s): Bhatia, B;
  • Karthik, J;
  • Cahill, DG;
  • Martin, LW;
  • King, WP
  • et al.

Published Web Location

https://doi.org/10.1063/1.3652771
Abstract

We report high temperature piezoresponse force microscopy (PFM) on 100 nm thick PbZr0.2Ti0.8O3 films fabricated on a miniature heater stage. The microfabricated resistive heater allows local temperature control up to 1000 C with minimal electrostatic interactions. The PFM measurements were used to collect piezoelectric hysteresis loops over the temperature range 25-400 C. The piezoresponse increases with temperature and then decreases rapidly near 400 C, which is indicative of ferroelectric- paraelectric phase transition. © 2011 American Institute of Physics.

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