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Considerations for Two Beam Interference on Excitation and Emission Light Paths for Structured Illumination Microscopy

  • Author(s): Bardales, Alex
  • Li, Qinggele
  • Tao, Xiaodong
  • Reinig, Marc
  • Kubby, Joel
  • et al.
Abstract

The use of adaptive optics correction for structured illumination microscopy requires spatial sinusoid patterns in the sample obtained via two beam interference. We simulate the effect of AO correction on both excitation and emission paths.

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