Skip to main content
Download PDF
- Main
Considerations for Two Beam Interference on Excitation and Emission Light Paths for Structured Illumination Microscopy
- Author(s): Bardales, Alex
- Li, Qinggele
- Tao, Xiaodong
- Reinig, Marc
- Kubby, Joel
- et al.
Abstract
The use of adaptive optics correction for structured illumination microscopy requires spatial sinusoid patterns in the sample obtained via two beam interference. We simulate the effect of AO correction on both excitation and emission paths.
Many UC-authored scholarly publications are freely available on this site because of the UC's open access policies. Let us know how this access is important for you.