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Microscopic return point memory in Co/Pd multilayer films

Abstract

We report soft x-ray speckle metrology measurements of microscopic return point and complementary point memory in Co/Pd magnetic films having perpendicular anisotropy. We observe that the domains assemble into a common labyrinth phase with a period that varies by nearly a factor of two between initial reversal and fields near saturation. Unlike previous studies of similar systems, the ability of the film to reproduce its domain structure after magnetic cycling through saturation varies from loop to loop, from position to position on the sample, and with the part of the speckle pattern used in the metrology measurements. We report the distribution of memory as a function of field and discuss these results in terms of the reversal process.

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