DXT: Darshan eXtended Tracing
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DXT: Darshan eXtended Tracing

  • Author(s): Xu, Cong
  • Snyder, Shane
  • Kulkarni, Omkar
  • Venkatesan, Vishwanath
  • Carns, Phillip
  • Byna, Surendra
  • Sisneros, Robert
  • Chadalavada, Kalyana
  • et al.

Published Web Location

https://cug.org/proceedings/cug2017_proceedings/includes/files/pap105s2-file1.pdf
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Abstract

As modern supercomputers evolve to exascale, their I/O subsystems are becoming increasingly complex, making optimization of I/O for scientific applications a daunting task. Although I/O profiling tools facilitate the process of optimizing application I/O performance, legacy profiling tools lack flexibility in their level of detail and ability to correlate traces with other sources of data. Additionally, a lack of robust trace analysis tools makes it difficult to derive actionable insights from large-scale I/O traces. Darshan is an HPC I/O characterization tool that records statistics in a lightweight manner that makes it appropriate for full-time production deployment. However, Darshan’s default characterization mechanism records information at a fixed granularity. We augment Darshan by proposing Darshan eXtended Tracing (DXT) for more detailed profiling of I/O software stacks. DXT enables users and administrators to vary the level of fidelity captured by Darshan at run time without modifying or recompiling applications. This capability facilitates systematic analysis on the I/O behavior of applications and can provide useful application kernel I/O traces to help advance parallel I/O research. We have demonstrated the power of DXT by obtaining a wide range of useful statistics for multiple case studies, and we further show that DXT is able to do so same with negligible overhead.

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