Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (PEEM)
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Exploring the microscopic origin of exchange bias with photoelectron emission microscopy (PEEM)

  • Author(s): Scholl, Andreas
  • Nolting, Frithjof
  • Stohr, Joachim
  • Regan, Tom
  • Luning, Jan
  • Seo, Jin Won
  • Locquet, Jean-Pierre
  • Fompeyrine, Jean
  • Anders, Simone
  • Ohldag, Hendrik
  • Padmore, Howard A.
  • et al.
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