Real-time interface investigation on degradation mechanism of organic light-emitting diode by in-operando X-ray spectroscopies
Published Web Locationhttps://doi.org/10.1016/j.orgel.2020.105901
Understanding the chemical evolution at the interface of organic light-emitting diodes (OLEDs) under working conditions is critical for addressing device failure and further improving performance. In this work, an in-operando approach was developed employing synchrotron-based X-ray absorption spectroscopy (XAS) to investigate the electronic structures and chemical degradation mechanisms of a model tris(8-hydroxyquinoline) aluminum (Alq3)-based OLED device under working condition. The results identify that Mg atoms from the electrode migrate into the Alq3 organic layer under a potential bias and replace Al atom sites, forming the unstable Mgq3 species which lead to device degradation. The findings from the classic and simple model device elucidate the degradation mechanisms occurred at the interface of OLED devices, which may facilitate the development of more efficient and stable OLED devices with complex structures.