Picosecond soft X-ray absorption measurement of the photo-induced insulator-to-metal transition in VO2.
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Picosecond soft X-ray absorption measurement of the photo-induced insulator-to-metal transition in VO2.

  • Author(s): Cavalleri, Andrea
  • Chong, Henry H.W.
  • Fourmaux, Sylvain
  • Glover, Thornton E.
  • Heimann, Phil A.
  • Kieffer, Jean Claude
  • Mun, B. Simon
  • Padmore, Howard A.
  • Schoenlein, Robert W.
  • et al.
Abstract

We directly measure the photoinduced insulator-to-metal transition in VO2 using time-resolved near-edge x-ray absorption. Picosecond pulses of synchrotron radiation are used to detect the redshift in the vanadium L3edge at 516 eV, which is associated with the transient collapse of the low-temperature band gap. We identify a two-component temporal response, corresponding to an ultrafast transformation over a 50 nm surface layer, followed by 40 m/s thermal growth of the metallic phase into the bulk.

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