Lawrence Berkeley National Laboratory

The quality of infrared microscopy and spectroscopy data collected at synchrotron based sources is strongly dependent on signal-to-noise. We have successfully identified and suppressed several noise sources affecting Beamlines 1.4.2, 1.4.3, and 1.4.4 at the Advanced Light Source (ALS), resulting in a significant increase in the quality of FTIR spectra obtained. In this paper, we present our methods of noise source analysis, the negative effect of noise on the infrared beam quality, and the techniques used to reduce the noise. These include reducing the phase noise in the storage ring radio-frequency (RF) system, installing an active mirror feedback system, analyzing and changing physical mounts to better isolate portions of the beamline optics from low-frequency environmental noise, and modifying the input signals to the main ALS RF system. We also discuss the relationship between electron beam energy oscillations at a point of dispersion and infrared beamline noise.