Magnetism in heterogeneous thin film systems: Resonant x-ray scattering studies
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Magnetism in heterogeneous thin film systems: Resonant x-ray scattering studies

  • Author(s): Kortright, J.B.;
  • Jiang, J.S.;
  • Bader, S.D.;
  • Hellwig, O.;
  • Marguiles, D.T.;
  • Fullerton, E.E.
  • et al.
Abstract

Magnetic and chemical heterogeneity are common in a broad range of magnetic thin film systems. Emerging resonant soft x-ray scattering techniques are well suited to resolve such heterogeneity at relevant length scales. Resonant x-ray magneto-optical Kerr effect measurements laterally average over heterogeneity but can provide depth resolution in different ways, as illustrated in measurements resolving reversible and irreversible changes in different layers of exchange-spring heterostructures. Resonant small-angle scattering measures in-plane heterogeneity and can resolve magnetic and chemical scattering sources in different ways, as illustrated in measurements of granular alloy recording media.

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