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GISAXS analysis for ionomer thin films

  • Author(s): Dudenas, P
  • Kusoglu, A
  • Hexemer, A
  • Weber, A
  • et al.
Abstract

An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepare and measure thin films using GISAXS is described. Typical features of ionomer scattering images are discussed before detailing three different types of analysis which can be used in conjunction with one another to elucidate additional information from scattering patterns. Example data are provided to illustrate these techniques.

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