Skip to main content
Download PDF
- Main
193 nm photodissociation of thiophene Probed using synchrotron radiation
Abstract
The photodissociation dynamics of thiophene, c-C4H4S, have been studied at 193 nm using tunable synchrotron undulator radiation as a universal product probe. Five primary dissociation channels have been observed, and the translational energy distributions and photoionization efficiency spectra have been recorded for all products. The evidence suggests that dissociation occurs on the ground-state surface following internal conversion.
Main Content
For improved accessibility of PDF content, download the file to your device.
Enter the password to open this PDF file:
File name:
-
File size:
-
Title:
-
Author:
-
Subject:
-
Keywords:
-
Creation Date:
-
Modification Date:
-
Creator:
-
PDF Producer:
-
PDF Version:
-
Page Count:
-
Page Size:
-
Fast Web View:
-
Preparing document for printing…
0%