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Height drift correction in non-raster atomic force microscopy

  • Author(s): Meyer, TR
  • Ziegler, D
  • Brune, C
  • Chen, A
  • Farnham, R
  • Huynh, N
  • Chang, JM
  • Bertozzi, AL
  • Ashby, PD
  • et al.

Published Web Location

http://www.sciencedirect.com/science/article/pii/S0304399113002891
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Abstract

We propose a novel method to detect and correct drift in non-raster scanning probe microscopy. In conventional raster scanning drift is usually corrected by subtracting a fitted polynomial from each scan line, but sample tilt or large topographic features can result in severe artifacts. Our method uses self-intersecting scan paths to distinguish drift from topographic features. Observing the height differences when passing the same position at different times enables the reconstruction of a continuous function of drift. We show that a small number of self-intersections is adequate for automatic and reliable drift correction. Additionally, we introduce a fitness function which provides a quantitative measure of drift correctability for any arbitrary scan shape. © 2013 The Author.

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