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Open Access Publications from the University of California

In Situ Transmission Electron Microscopy: A Powerful Tool for the Characterization of Carrier-Selective Contacts

  • Author(s): Ali, H;
  • Koul, S;
  • Gregory, G;
  • Bullock, J;
  • Javey, A;
  • Kushima, A;
  • Davis, KO
  • et al.

The goal of this paper is to provide an overview of an in situ transmission electron microscopy (TEM) technique used to study the thermal stability of various transition metal oxide-based contacts used as carrier-selective contacts in silicon solar cells. In the present work, MoOx/Al and WOx/Al were investigated as hole-selective rear contacts using a combination of in situ TEM and transmission line measurements (TLM).

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