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In Situ Transmission Electron Microscopy: A Powerful Tool for the Characterization of Carrier-Selective Contacts

  • Author(s): Ali, H
  • Koul, S
  • Gregory, G
  • Bullock, J
  • Javey, A
  • Kushima, A
  • Davis, KO
  • et al.
Abstract

© 2019 IEEE. The goal of this paper is to provide an overview of an in situ transmission electron microscopy (TEM) technique used to study the thermal stability of various transition metal oxide-based contacts used as carrier-selective contacts in silicon solar cells. In the present work, MoOx/Al and WOx/Al were investigated as hole-selective rear contacts using a combination of in situ TEM and transmission line measurements (TLM).

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