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X-ray absorption spectroscopy using a self-seeded soft X-ray free-electron laser

  • Author(s): Kroll, T
  • Kern, J
  • Kubin, M
  • Ratner, D
  • Gul, S
  • Fuller, FD
  • Löchel, H
  • Krzywinski, J
  • Lutman, A
  • Ding, Y
  • Dakovski, GL
  • Moeller, S
  • Turner, JJ
  • Alonso-Mori, R
  • Nordlund, DL
  • Rehanek, J
  • Weniger, C
  • Firsov, A
  • Brzhezinskaya, M
  • Chatterjee, R
  • Lassalle-Kaiser, B
  • Sierra, RG
  • Laksmono, H
  • Hill, E
  • Borovik, A
  • Erko, A
  • Föhlisch, A
  • Mitzner, R
  • Yachandra, VK
  • Yano, J
  • Wernet, P
  • Bergmann, U
  • et al.

Published Web Location

https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-24-20-22469&id=350231
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Abstract

© 2016 Optical Society of America. X-ray free electron lasers (XFELs) enable unprecedented new ways to study the electronic structure and dynamics of transition metal systems. L-edge absorption spectroscopy is a powerful technique for such studies and the feasibility of this method at XFELs for solutions and solids has been demonstrated. However, the required x-ray bandwidth is an order of magnitude narrower than that of self-amplified spontaneous emission (SASE), and additional monochromatization is needed. Here we compare L-edge x-ray absorption spectroscopy (XAS) of a prototypical transition metal system based on monochromatizing the SASE radiation of the linac coherent light source (LCLS) with a new technique based on self-seeding of LCLS. We demonstrate how L-edge XAS can be performed using the self-seeding scheme without the need of an additional beam line monochromator. We show how the spectral shape and pulse energy depend on the undulator setup and how this affects the x-ray spectroscopy measurements.

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