Towards Scalable Sub-THz Massive MIMO: Beamforming ASICs and 3D Die-to-Die Interconnects
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Towards Scalable Sub-THz Massive MIMO: Beamforming ASICs and 3D Die-to-Die Interconnects

Abstract

The incessant growth of wireless communication demand is driving the desire for massive antenna arrays operating at mm-Wave to sub-THz carrier frequencies, where many GHz of bandwidth are readily available. However, this opportunity comes with an integration dilemma as antenna pitch falls below 1mm and digitized baseband data rates surpass a terabit per second. To address these and other design challenges, heterogeneous integration (HI) of radio, mixed-signal, baseband, and power delivery chiplets is a solution. Towards this goal, this dissertation presents a multi-part exploration into the technologies and design methodologies required for future sub-THz massive MIMO systems.

First, a pair of baseband ASICs for scalable linear massive MIMO arrays with digital beamforming is presented. The learnings from the design process of these chips is directly applied to the improvement of Hammer, a physical design flow generator, that has since accelerated the implementation of over ten research chips and is now used in multiple courses. Extrapolating from the integration limitations of the presented and other state-of-the-art chips, the scaling challenges and HI opportunities of sub-THz two-dimensional massive MIMO arrays is subsequently reviewed. The findings culminate in a case for 3D chiplet integration into ”radio cubes”, which are consequently tiled horizontally into a scalable array. To enable 3D integration, a comprehensive study of technology constraints for standardizing 3D die-to-die interconnects is performed, demonstrating how scaling roadmaps for process and packaging technologies converge towards a very different circuit architecture compared to existing die-to-die interconnects. Given the opportunities afforded by this architecture, a Chisel generator framework is presented that performs rapid design space exploration for a novel defect repair mechanism and validates a new standard (UCIe-3D) in the Intel 16 process technology. Most importantly, this generator demonstrates a significant design effort reduction for exploring and implementing die-to-die interconnects–a key enabler for a future chiplet ecosystem. Finally, with solutions proposed for key technologies needed for the envisioned heterogeneously-integrated system, a set of integration concepts is presented, detailing remaining technological feasibility tradeoffs.

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