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BiCMOS Sampling Circuits for High-Speed Data Converters


This thesis introduces several high-speed, high-linearity sampling circuits designed in InP and SiGe BiCMOS processes, with applications in tests and measurement, optical networking and direct RF sampling. As a result of expanding high frequency operability, test and measurement equipment requires increased bandwidth capacity, which places increasing strain on data converters in these systems. In addition, optical backplanes have enabled 100Gbps data rates in high-speed network systems, pushing electrical transceivers to support sampling rates in excess of 56GS/s with moderate to high resolution. These applications place incredible pressure on broadband high- resolution data converter to perform at speeds not previously attained. As the demand for higher data rates continues to increase, the applicability and market for these systems will undoubtedly grow. A 40GS/s high- resolution track-and-hold, and time interleaved system are introduced for broadband Nyquist rate sampling in high bit rate optical sampling and measurement applications. Direct RF sampling possesses advantages when used in reconfigurable radios, which address developing markets in wireless communications. This work introduces a pair of novel track-and-hold amplifiers capable of operating at 30 -40GS/s, with low power consumption and high linearity. These systems are useful for direct RF sampling in reconfigurable radios, where power consumption is a limiting factor. The architectures described in this work help to advance the state of the art, through innovative circuit techniques which improve upon existing technologies, and support high bit rate and high frequency applications

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