UC Berkeley

Angle-resolved photoemission spectroscopy (ARPES) has provided a direct, high resolution probe of materials’ surface electronic band structure for analysis of the underlying mechanisms of their macroscopic electronic properties. With increasing device complexity, spatially mapped ARPES measurements are increasingly necessary to reveal spatial heterogeneities in the band structure of a device. However, with leading techniques, spatial mapping significantly increases the time needed to collect a full dataset because they use a scanning probe.This dissertation covers my efforts to develop and commission a photoemission spectromicroscope that can directly image a sample in either real or reciprocal space. The improved measurement efficiency of this technique compared to a scanning probe has the potential to significantly reduce measurement time of ordinarily scanned datasets. Additionally, direct spatial imaging and time-of-flight spectroscopy can produce higher spatial and energy resolution than scanned imaging and dispersive spectroscopy, respectively.The effort was a combination of electron optics simulations and optimization, hardware development, and testing and troubleshooting the spectromicroscope. Chapter 1 discusses the underlying principles and advantages of the measurement method. Chapter 2 discusses simulation and optimization developments for optimal operation of the analyzer. Chapter 3 discusses the troubleshooting and commissioning effort to develop the photoelectron analyzer. Finally, chapter 4 discusses a supplementary effort to develop a transmission spin polarimeter.