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Non-negative matrix analysis in x-ray spectromicroscopy: Choosing regularizers
Published Web Location
https://www.mcs.anl.gov/papers/P5328-0415.pdfNo data is associated with this publication.
Abstract
In x-ray spectromicroscopy, a set of images can be acquired across an absorption edge to reveal chemical speciation. We previously described the use of non-negative matrix approximation methods for improved classification and analysis of these types of data. We present here an approach to find appropriate values of regularization parameters for this optimization approach.