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Modulation of prompt fast-ion loss by applied n = 2 fields in the DIII-D tokamak

  • Author(s): Van Zeeland, MA
  • Ferraro, NM
  • Heidbrink, WW
  • Kramer, GJ
  • Pace, DC
  • Chen, X
  • Evans, TE
  • Fisher, RK
  • García-Muñoz, M
  • Hanson, JM
  • Lanctot, MJ
  • Lao, LL
  • Moyer, RA
  • Nazikian, R
  • Orlov, DM
  • et al.
Abstract

Energy and pitch angle resolved measurements of escaping neutral beam ions (E ≈ 80 keV) have been made during DIII-D L-mode discharges with applied, slowly rotating, n = 2 magnetic perturbations. Data from separate scintillator detectors (FILDs) near and well below the plasma midplane show fast-ion losses correlated with the internal coil (I-coil) fields. The dominant fast-ion loss signals are observed to decay within one poloidal transit time after beam turn-off indicating they are primarily prompt loss orbits. Also, during application of the rotating I-coil fields, outboard midplane edge density and bremsstrahlung emission profiles exhibit a radial displacement of up to δR ≈ 1 cm. Beam deposition and full orbit modeling of these losses using M3D-C1 calculations of the perturbed kinetic profiles and fields reproduce many features of the measured losses. In particular, the predicted phase of the modulated loss signal with respect to the I-coil currents is in close agreement with FILD measurements as is the relative amplitudes of the modulated losses for the co and counter-current beam used in the experiment. These simulations show modifications to the beam ion birth profile and subsequent prompt loss due to changes in the edge density; however, the dominant factor causing modulation of the losses to the fast-ion loss detectors is the perturbed magnetic field (δB/B ≈ 10-3 in the plasma). Calculations indicate total prompt loss to the DIII-D wall can increase with application of the n = 2 perturbation by up to 7% for co-current injected beams and 3% for counter-current injected beams depending on phase of the perturbation relative to the injected beam. © 2014 IOP Publishing Ltd.

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