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Surface structure of water from soft X-ray second harmonic generation
- Hoffman, David J;
- Devlin, Shane W;
- Garratt, Douglas;
- Jamnuch, Sasawat;
- Spies, Jacob A;
- Nebgen, Bailey R;
- Schacher, Daniel;
- Do, Alexandria;
- Bernal, Franky;
- Riffe, Erika J;
- Kunnus, Kristjan;
- Hampton, Christina Y;
- Duris, Joseph;
- Cesar, David;
- Sudar, Nicholas;
- Dakovski, Georgi L;
- Drisdell, Walter S;
- Lawler, Keith V;
- Marinelli, Agostino;
- Zuerch, Michael W;
- Saykally, Richard J;
- Schwartz, Craig P;
- Pascal, Tod A;
- Koralek, Jake D
Published Web Location
https://doi.org/10.1038/s41467-025-65514-4Abstract
The microscopic structure of water’s surface is crucial to many natural and industrial processes, but studying its hydrogen bond (H-bond) network directly remains challenging due to the required interfacial sensitivity of experimental techniques. By leveraging advances in flat liquid sheet microjets and terawatt-scale attosecond soft X-ray pulses from the LCLS X-ray free electron laser, we employed soft X-ray second harmonic generation (SXSHG) spectroscopy to examine the liquid water/vapor interface. SXSHG combines the elemental selectivity of X-ray spectroscopies with the surface selectivity of SHG and gives access to the electronic structure of interfacial species. Here, we show the SXSHG spectrum differs from bulk water’s X-ray absorption, with its peak shifted several eV, indicating a vastly different electronic environment at the interface as compared to the bulk. First-principles electronic structure calculations show the signal is highly sensitive to H-bond interactions, such as water molecules accepting a single H-bond, which are surface abundant.
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