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Test results on silicon micro-strip detectors for ATLAS

  • Author(s): DeWitt, J
  • Dorfan, DE
  • Dubbs, T
  • Grillo, AA
  • Kashigin, S
  • Kroeger, W
  • Pulliam, T
  • Rahn, J
  • Rowe, WA
  • Sadrozinski, HFW
  • Seiden, A
  • Spencer, E
  • Webster, A
  • Wichmann, R
  • Wilder, M
  • Williams, DC
  • Dane, J
  • Lankford, A
  • Pier, S
  • Schmid, B
  • Bonino, R
  • Couyoumtzelis, C
  • Demierre, P
  • Fujita, K
  • Handa, T
  • Iwata, Y
  • Ohsugi, T
  • Iwasaki, H
  • Kohriki, T
  • Kondo, T
  • Terada, S
  • Unno, Y
  • Takashima, R
  • Ciocio, A
  • Collins, T
  • Emes, J
  • Gilchriese, MGD
  • Haber, C
  • Kipnis, I
  • Shapiro, M
  • Siegrist, J
  • Spieler, H
  • Moorhead, G
  • Nakao, M
  • Tamura, N
  • Dabrowski, W
  • Idzik, M
  • Godlewski, J
  • Grewal, A
  • Nickerson, R
  • Wastie, R
  • Gao, Y
  • Gonzalez, S
  • Walsh, AM
  • Feng, Z
  • et al.
Abstract

We report results from beam tests on silicon microstrip detectors using a binary readout system for ATLAS. The data were collected during the H8 beam test at CERN in August/September 1995 and the KEK test in February 1996. The binary modules tested had been assembled from silicon microstrip detectors of different layout and from front-end electronics chips of different architecture. The efficiency, noise occupancy and position resolution were determined as a function of the threshold setting for various bias voltages and angles of incidence for both irradiated and non-irradiated detectors. In particular, the high spatial resolution of the beam telescope allowed the evaluation of the performance as a function of the track location in between detector strips.

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