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Oxidation and Reduction of Polycrystalline Cerium Oxide Thin Films in Hydrogen
- Yaacov, Adva Ben;
- Falling, Lorenz J;
- David, Roey Ben;
- Attia, Smadar;
- Andrés, Miguel A;
- Nemšák, Slavomír;
- Eren, Baran
Published Web Location
https://doi.org/10.1021/acs.jpclett.3c01662Abstract
This study investigates the oxidation state of ceria thin films' surface and subsurface under 100 mTorr hydrogen using ambient pressure X-ray photoelectron spectroscopy. We examine the influence of the initial oxidation state and sample temperature (25-450 °C) on the interaction with hydrogen. Our findings reveal that the oxidation state during hydrogen interaction involves a complex interplay between oxidizing hydride formation, reducing thermal reduction, and reducing formation of hydroxyls followed by water desorption. In all studied conditions, the subsurface exhibits a higher degree of oxidation compared to the surface, with a more subtle difference for the reduced sample. The reduced samples are significantly hydroxylated and covered with molecular water at 25 °C. We also investigate the impact of water vapor impurities in hydrogen. We find that although 1 × 10-6 Torr water vapor oxidizes ceria, it is probably not the primary driver behind the oxidation of reduced ceria in the presence of hydrogen.
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