UC Berkeley

Defects in microarchitected materials exhibit a dual nature, capable of both unlocking innovative functionalities and degrading their performance. Specifically, while intentional defects are strategically introduced to customize and enhance mechanical responses, inadvertent defects stemming from manufacturing errors can disrupt the symmetries and intricate interactions within these materials. In this study, we demonstrate a nondestructive optical imaging technique that can precisely locate defects inside microscale metamaterials, as well as provide detailed insights on the specific type of defect.